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X-Ray Photoelectron Spectroscopy (XPS) for Thin Films & Coatings - Electronics and Computers
Thin films and coatings play a pivotal role in a diverse range of industries, including electronics, optics, and materials science. Understanding the chemical composition of these films is crucial for optimising their performance and ensuring their desired functionalities. X-ray Photoelectron Spectroscopy (XPS) provides valuable insights into the elemental and chemical composition of thin films and coatings.
Quantitative, elemental & chemical analysis
XPS allows the identification and quantification of elements present on the surface of thin films and coatings. By analysing the binding energies of the photoelectrons, it is possible to determine the elemental composition, providing critical information for quality control and material characterisation.
Furthermore, the quantitative nature of XPS makes it an indispensable tool for determining the concentration of elements within a thin film or coating. This information is vital for tailoring material properties to specific requirements.
It is also important to note that XPS is sensitive to the chemical state of elements, providing information about their oxidation states and bonding environments. This is particularly valuable when assessing the stability and reactivity of thin films, as changes in chemical states can impact the material’s performance over time. An example of the value of XPS applied to thin-film characterisation is the chemical state determination of chromate passivation chemistries.