Inray Oy Ltd products

Our measurement technology is based on X-ray scanning, in which the radiation is produced by an electromagnetic radiation source. In the measurement, radiation is directed to the material being measured, such as chips or logs, and the transmitted radiation is measured with a high-resolution sensor. The measurement data from the sensor is used to generate X-ray images to analyse, depending on the material, moisture and contaminant levels in real-time, and to identify foreign objects with a higher density than the material, such as metals and stones.