Shenzhen Bonad Instrument Co., Ltd.
Bonad - Model BND-TPK08 IEC62368 -Test Probe Kit
BND-TPK08 IEC62368-1:2010 test probe kitstandard:IEC62368-1:20101. Figure V.1 – Jointed test probe for equipment likely to be accessible to children2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children3. Figure V.3 – Blunt probe4. Figure V.4 – Wedge probe.
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BND-TPK08 IEC62368-1:2010 test probe kit
standard:IEC62368-1:2010
1. Figure V.1 – Jointed test probe for equipment likely to be accessible to children
2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children
3. Figure V.3 – Blunt probe
4. Figure V.4 – Wedge probe
5. Figure V.5 – Terminal probe