Grazing Incidence X-ray diffraction with the Aeris diffractometer

Grazing incidence X-ray diffraction (GIXRD) analysis is usually performed on thin film samples. To perform GIXRD on on a compact X-ray diffractometer like the Aeris, you need a parallel beam set-up. We demonstrate exactly how this works. The quality of the data proves that Aeris is your partner for studying polycrystalline coatings, whether you need detailed studies of crystalline phases, or rapid high throughput quality control.