CDSemi V3000 Macro-scope Defect Review System - Video

The V3000 Macro-Scope Defect Review System is a powerful, easy-to-use, dual-cassette, all-in-one wafer inspection system that is able to handle both macro- and micro-inspection of wafers. The system can be operated in either automatic or manual mode, making it possible to perform automated and manual inspections both on one system.