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Wafer Inspection Equipment & Supplies
2 equipment items found
Manufactured by:C&D Semiconductor Services Inc. based inSan Jose, CALIFORNIA (USA)
The V3000 Macro-Scope Defect Review System is a powerful, easy-to-use, dual-cassette, all-in-one wafer inspection system that is able to handle both macro- and micro-inspection of wafers. The system can be operated in either automatic or manual mode, making it possible to perform automated and manual ...
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Manufactured by:Applied Physics based inTampa, FLORIDA (USA)
Silica Microspheres Nano-particles Particle Size Standards and Micro-beads. Silica nano-particles size standards used in Contamination wafer standards and drug ...