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EddyCus TF - Model Lab 2020 - Non-Contact Sheet Resistance Device and Thickness Device
FromSURAGUS GmbH
Contact-free & real-time. Accurate sheet resistance measurement of conductive thin films with a sample size up to 200 x 200 mm. Film thickness measurement of metal films (nm, µm). Substrate thickness monitoring (µm). Characterization of encapsulated layers and multilayer systems.
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film thickness measurement
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- High usability
- Real-time depiction of sheet resistanceor layer thickness
- Collection of data sets, saving and data export function
- Possibility of software-guided manual sheet resistance mapping
- Architectural glass (LowE)
- Touch screens & flat monitors
- OLED & LED applications
- Smart-glass applications
- Graphene layers
- Transparent antistatic foils
- Photovoltaics
- Semiconductors
- De-icing & heating applications
- Batteries & fuel cells
- Packaging materials