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Spectrometry Equipment Supplied In Usa New York
1 equipment items found
Manufactured by:VJ X-Ray based inBohemia, NEW YORK (USA)
Its focal spot size is 1.0 mm with a cone beam angle of 24°, ensuring precise targeting necessary for numerous applications, including material analysis, sorting, recycling, thickness gauging, and X-ray spectrometry. Lightweight with a generator weight of 2.4 kg and control box weight of 0.4 kg, it allows for optimal system integration without compromising form factor. The ...
