SURAGUS GmbH
EddyCus TF - Model Lab 2020 - Non-Contact Sheet Resistance Device and Thickness Device
FromSURAGUS GmbH
Contact-free & real-time. Accurate sheet resistance measurement of conductive thin films with a sample size up to 200 x 200 mm. Film thickness measurement of metal films (nm, µm). Substrate thickness monitoring (µm). Characterization of encapsulated layers and multilayer systems.
Most popular related searches
film thickness measurement
thickness monitoring
encapsulation system
metal thickness monitoring
conductivity monitoring
- High usability
- Real-time depiction of sheet resistanceor layer thickness
- Collection of data sets, saving and data export function
- Possibility of software-guided manual sheet resistance mapping
- Architectural glass (LowE)
- Touch screens & flat monitors
- OLED & LED applications
- Smart-glass applications
- Graphene layers
- Transparent antistatic foils
- Photovoltaics
- Semiconductors
- De-icing & heating applications
- Batteries & fuel cells
- Packaging materials